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1

Quality management – history and trends

Vidosav Majstorovic and Dr Albert W, Professor, Weckenmann, Albert, Akkasoglu, Goekhan, Werner, Teresa

Journal:

The TQM Journal

Year:

2015

Language:

english

File:

PDF, 525 KB

english, 2015

2

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Fabrication of annular waveguide layer capillary optical fiber preform and temperature field distribution during fiber draw

Zhang, Minghui, Zhang, Tao, Liu, Guanyu, Fan, Zhaoceng, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, J

Year:

2011

Language:

english

File:

PDF, 12.55 MB

english, 2011

3

Koordinatenmesstechnik (Flexible Strategien für funktions- und fertigungsgerechtes Prüfen) ||

Weckenmann, Albert

Year:

2012

Language:

german

File:

PDF, 4.75 MB

german, 2012

4

Environmental life cycle assessment with support of fuzzy-sets

Albert Weckenmann, Achim Schwan

Journal:

The International Journal of Life Cycle Assessment

Year:

2001

Language:

english

File:

PDF, 948 KB

english, 2001

5

Measurement uncertainty evaluation of optical multi-sensor-measurements

Bernstein, Johannes, Weckenmann, Albert

Journal:

Year:

2012

Language:

english

File:

PDF, 1.29 MB

english, 2012

6

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - A method of fabricating blazed grating by homogenous grating mask

Chen, Minghui, Liu, Quan, Wu, Jianhong, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 391 KB

english, 2011

7

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology - Design and fabrication of the progressive addition lenses

Weber, Larry, Qin, Linling, Qian, Lin, Kwok, Hoi S., Hou, Yanbing, Yu, Jingchi, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 6.13 MB

english, 2011

8

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology - Enhanced infrared normal spectral emissivity of microstructured silicon at 200 to 400 °C

Weber, Larry, Feng, Guojin, Li, Yuan, Kwok, Hoi S., Hou, Yanbing, Wang, Yu, Li, Ping, Yang, Lianxiang, Yu, Chongxiu, Guo, Tingting, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo

Year:

2011

Language:

english

File:

PDF, 694 KB

english, 2011

9

Preventive ecological LCA of printing process with ‘green fit’ software comparison of three different printing processes currently available

Albert Weckenmann, Achim Schwan, Lindita Bushi

Journal:

The International Journal of Life Cycle Assessment

Year:

2001

Language:

english

File:

PDF, 113 KB

english, 2001

10

Inductive and Transformative Transducers with Short-Circuiting Ring

Weckenmann, Albert

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

1974

Language:

english

File:

PDF, 1.05 MB

english, 1974

11

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - The polishing detection method of side-polished fiber

Zhang, Yaxun, Wang, Lei, Liu, Zhihai, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 4.05 MB

english, 2011

12

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Comparison and analysis on the methods of improving the image quality in digital hologram reconstruction

Li, Jiansu, Wang, Zhao, Gao, Jianmin, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 4.77 MB

english, 2011

13

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Surface plasmon polaritions excitation by radially polarized vortex beams

Gu, Wenjun, Zhou, Zhehai, Tan, Qiaofeng, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 5.07 MB

english, 2011

14

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Nanopositioning and measuring technique

Jaeger, Gerd, Manske, Eberhard, Hausotte, Tino, Buechner, Hans-Joachim, Gruenwald, Rainer, Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 602 KB

english, 2002

15

Metrology - Base for Scientific Cognition and Technical Production

Weckenmann, Albert, Krämer, Philipp, Akkasoglu, Goekhan

Journal:

Advanced Materials Research

Year:

2012

Language:

english

File:

PDF, 4.97 MB

english, 2012

16

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Binary optics in China

Jin, Guofan, Tan, Qiaofeng, Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 474 KB

english, 2002

17

Ein Modellbildungskonzept für die praxisgerechte Bestimmung der Messunsicherheit (A Modelling Concept for Practice-Oriented Evaluation of Measurement Uncertainty)

Heidenblut, Stefan, Kessel, Rüdiger, Sommer, Klaus-Dieter, Weckenmann, Albert

Journal:

tm - Technisches Messen

Year:

2007

Language:

german

File:

PDF, 620 KB

german, 2007

18

Mehrbild-Messungen mit einem optischen Bi-Sensor-Messsystem Profilmessungen in der Strangprofil-FertigungMultiple Measurements with an Optical Bi-Sensorial System Measurement of Extruded Profiles in Manufacturing

Weckenmann, Albert, Bernstein, Johannes

Journal:

tm - Technisches Messen

Year:

2009

Language:

german

File:

PDF, 458 KB

german, 2009

19

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Nanometrology: problems and solutions

Kalendin, V. V., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 732 KB

english, 2002

20

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Compact absolute shaft angular encoder based on diffractive optical elements

Bessmeltsev, Victor P., Goldin, V. L., Kurbatov, E. M., Poleshchuk, Alexander G., Sedukhin, Andrey G., Vileiko, V. V., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 324 KB

english, 2002

21

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Surface and nanometrology: Markov and fractal scale of size properties

Whitehouse, David J., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 443 KB

english, 2002

22

Collaborative Research Centre 694 “Integration of electronic components into mobile systems”–Motivation and survey

Albert Weckenmann, Lorenz-Peter Schmidt, Martin Bookjans

Journal:

Physics Procedia

Year:

2010

Language:

english

File:

PDF, 564 KB

english, 2010

23

Virtual Quality Management–Validation of measurement systems by the use of simulation technologies

Martin Bookjans, Albert Weckenmann

Journal:

Physics Procedia

Year:

2010

Language:

english

File:

PDF, 670 KB

english, 2010

24

Construction and evaluation of a traceable metrological scanning tunnelling microscope

Joerg Hoffmann, Alexander Schuler, Albert Weckenmann

Journal:

Year:

2009

Language:

english

File:

PDF, 1.44 MB

english, 2009

25

User interface for optical multi-sensorial measurements at extruded profiles

Johannes Bernstein, Albert Weckenmann

Journal:

Year:

2011

Language:

english

File:

PDF, 974 KB

english, 2011

26

10th CIRP Conference on Computer Aided Tolerancing CAT 2007

Albert Weckenmann, Jörg Hoffmann

Journal:

Precision Engineering

Year:

2010

Language:

english

File:

PDF, 69 KB

english, 2010

27

Nano fabrication of star structure for precision metrology developed by focused ion beam direct writing

Zongwei Xu, Fengzhou Fang, Haifeng Gao, Yibo Zhu, Wei Wu, Albert Weckenmann

Journal:

CIRP Annals - Manufacturing Technology

Year:

2012

Language:

english

File:

PDF, 1.07 MB

english, 2012

28

Sustainable quality assurance by assuring competence of employees

Teresa Werner, Albert Weckenmann

Journal:

Year:

2012

Language:

english

File:

PDF, 195 KB

english, 2012

29

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Applications of x-ray interferometry in metrology and phase-contrast imaging

Mana, Giovanni, Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 725 KB

english, 2002

30

Editorial – Manufacturing Metrology

Weckenmann, Albert

Journal:

Year:

2012

Language:

english

File:

PDF, 102 KB

english, 2012

31

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Subwavelength binary blazed grating optical switch based on TiO2-on-SiO2

Yang, Junbo, Wei, Zhou, Zhang, Hualiang, Zhang, Xueao, Jia, Honghui, Qin, Shiqiao, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji

Year:

2011

Language:

english

File:

PDF, 1.45 MB

english, 2011

32

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Study of the vapor cell size at high sensitive Cs magnetometer

Li, Jiuxing, Liu, Qiang, Li, Qingmeng, Zhang, Junhai, Sun, Weimin, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Pe

Year:

2011

Language:

english

File:

PDF, 983 KB

english, 2011

33

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Simultaneous measurements of optical and thermal properties of solids at laser heating up to 2500 degrees C

Tsarkova, Olga G., Garnov, Serge V., Konov, Vitali I., Lubnin, E. N., Dausinger, Friedrich, Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 418 KB

english, 2002

34

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrolo - Accelerated aging test on LEDs life estimation

Dong, Yi, Zhang, Shu-sheng, Du, Jiang-qi, Weber, Larry, Kwok, Hoi S., Hou, Yanbing, Yang, Lianxiang, Yu, Chongxiu, Fang, Fengzhou, Weckenmann, Albert, Zhao, Ji, Zeppenfeld, Peter, Luo, Jack

Year:

2011

Language:

english

File:

PDF, 429 KB

english, 2011

35

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Diffraction method for checking the sidebar defects of a small round hole

Magurin, Vitaly G., Tarlykov, Vladimir A., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert

Year:

2002

Language:

english

File:

PDF, 570 KB

english, 2002

36

Information Control Problems in Manufacturing 2006 || A process modelling approach for design of experiments software

Weckenmann, Albert

Year:

2006

Language:

english

File:

PDF, 1.69 MB

english, 2006

37

Preface

Jiang, Xiangqian, Mathieu, Luc, Weckenmann, Albert

Journal:

Year:

2013

Language:

english

File:

PDF, 212 KB

english, 2013

38

Obituary.

Jiang, Xiangqian, Mathieu, Luc, Weckenmann, Albert

Journal:

Year:

1892

Language:

english

File:

PDF, 218 KB

english, 1892

39

Function-oriented method for the definition and verification of microstructured surfaces

Weckenmann, Albert, Hartmann, Wito

Journal:

Precision Engineering

Year:

2013

Language:

english

File:

PDF, 1.94 MB

english, 2013

40

Methodic Design of a Customized Maturity Model for Geometrical Tolerancing

Weckenmann, Albert, Akkasoglu, Gökhan

Journal:

Year:

2013

Language:

english

File:

PDF, 610 KB

english, 2013

41

Optical Multi-Sensor-Measurements in the Shop by Compensating Environmental Influences

Weckenmann, Albert, Bernstein, Johannes

Journal:

Year:

2013

Language:

english

File:

PDF, 815 KB

english, 2013

42

Interpreting the probe-surface interaction of surface measuring instruments, or what is a surface?

Leach, Richard, Weckenmann, Albert, Coupland, Jeremy, Hartmann, Wito

Journal:

Surface Topography: Metrology and Properties

Year:

2014

Language:

english

File:

PDF, 1.84 MB

english, 2014

43

Computed Tomography for Application in Manufacturing Metrology

Weckenmann, Albert, Krämer, Philipp

Journal:

Key Engineering Materials

Year:

2010

Language:

english

File:

PDF, 2.08 MB

english, 2010

44

A Review of: “Precision Engineering, V. C. Venkatesh, S. Izman”

Weckenmann, Albert

Journal:

Machining Science and Technology

Year:

2009

Language:

english

File:

PDF, 36 KB

english, 2009

45

Setup and evaluation of a sensor tilting system for dimensional micro- and nanometrology

Schuler, Alexander, Weckenmann, Albert, Hausotte, Tino

Journal:

Measurement Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.29 MB

english, 2014

46

Verifying the functional ability of microstructured surfaces by model-based testing

Hartmann, Wito, Weckenmann, Albert

Journal:

Measurement Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.48 MB

english, 2014

47

Development of a tunnelling current sensor for a long-range nano-positioning device

Weckenmann, Albert, Hoffmann, Jörg, Schuler, Alexander

Journal:

Measurement Science and Technology

Year:

2008

Language:

english

File:

PDF, 812 KB

english, 2008

48

Maturity Determination of New Forming Processes Considering Uncertain Indicator Values

Weckenmann, Albert, Akkasoglu, Goekhan

Journal:

Key Engineering Materials

Year:

2012

Language:

english

File:

PDF, 347 KB

english, 2012

49

Holistic Measurement in the Sheet-Bulk Metal Forming Process with Fringe Projection

Ohrt, Christoph, Hartmann, Wito, Weickmann, Johannes, Kästner, Markus, Weckenmann, Albert, Hausotte, Tino, Reithmeier, Eduard

Journal:

Key Engineering Materials

Year:

2012

Language:

english

File:

PDF, 1.34 MB

english, 2012

50

Maturity Model for the Development of New Forming Processes Applied to the Sheet-Bulk Metal Forming

Weckenmann, Albert, Akkasoglu, Gökhan

Journal:

Key Engineering Materials

Year:

2012

Language:

english

File:

PDF, 330 KB

english, 2012

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